FOG Lighting Test + TP Testing Machine
Designed for FOG (Flex-on-Glass) inspection of 1- to 7-inch displays, our FOG lighting and TP (Touch Panel) tester features a rotary table-based integrated structure. It consolidates three core functions to achieve fully automated processing, enabling millisecond-level defect identification and quality control.
Cycle Time: 4 s/pcs
Detection Accuracy: 1 µm
Accuracy Rate: ≥ 99.9%
Core Product Advantages
High-Efficiency Adaptation · Precision Assurance · Production Breakthrough
Fully Automatic Lighting
Dual Upgrade in Efficiency and Automation
Integrated Turntable Structure
The rotary table design is capable of LCD/OLED (FOG segment) binding, TP testing, and comprehensive AOI defect inspection.
FS Proprietary Optics & Algorithms
Enable Stable and Accurate Defect Detection
Real-Time Data Storage and Traceability
Classifier Empowerment: Filters Surface Interference, Reduces False Calls, and Enhances Detection Reliability
Through FS's self-developed optical system, the signal-to-noise ratio of defect presentation is significantly enhanced. Combined with the FS defect algorithm model, outstanding algorithmic capabilities such as localized defect attention mechanisms, high-dimensional feature extraction, and global linear feature extraction are improved, enabling stable and accurate detection of various types of defects.
The entire production line utilizes a rotary table structure, integrating functions for binding code, TP testing, and AOI inspection. It supports the detection of LCD/OLED displays (FOG segment) by capturing high-definition images of the glass. Under microscopic conditions, the system analyzes point defects, line defects, Mura, and other screen flickering anomalies on the glass products.
The system revolutionizes the traditional manual connection and lighting method by adopting BTB automatic pressing technology, which requires no manual intervention throughout the entire process: The feeding robot accurately places the product onto the test fixture, the pressing mechanism automatically aligns and connects the interface to initiate lighting, and the process seamlessly proceeds to subsequent API screen inspection and TP testing.
The industrial computer stores inspection data (including test results, timestamps, and product IDs) and interfaces with the factory control center via Ethernet, supporting historical data queries and yield analysis.
Micron-Level Precision
Foreground Image
Algorithm Processing Diagram
Inspection Result Image
Exceptional Performance in Both Error Control and Recognition Rate
Both appearance defect recognition rate and dimensional measurement error are controlled within 1μm, far exceeding industry inspection standards.
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