Tianshi D-U
The Tianshi D-U Aging Test Machine is dedicated to creating an intelligent testing experience for all scenarios, delivering groundbreaking innovative solutions in the display module industry.
Omni-capable Signal Core
Smart Editing Platform
Multi-Scenario Application
Automated Production Line Integration
The system integrates 4 eDP interfaces and 6 power outputs, supporting VCI/VDDIO/AVDD/DVDD/ELVDD/ELVSS power modes, comprehensively meeting diverse testing requirements for OLED display modules.
The dedicated software allows users to freely configure Timing/Pattern/Program, enabling rapid creation of customized test cases for highly efficient automated testing workflows.
This solution is designed for OLED display modules, supporting offline lighting, aging tests, quality assurance validation, and R&D debugging, while enabling multi-dimensional testing capabilities including signal integrity，
image quality, and electrical performance.
The system seamlessly integrates with AOI (Automated Optical Inspection), Demura, and other equipment to achieve high-efficiency detection in automated production lines, thereby enhancing production efficiency and product quality.
灰阶
彩条
放射
放射
Product Function Description |
monochrome
character
crosshair
color bar
gradient
chessboard pattern
radiation
gray scale
· Lighting signal type：
· Test screen:
· Automatic screen switching function:
· Cross cursor function:
·System software editor:
· Test Pattern Configuration Function：
The PC-based software allows users to configure parameters—such as power on/off timing, scanning sequence, voltage/current protection ranges, and test patterns—based on the module’s technical specifications. It delivers comprehensive testing capabilities with user-friendly operation.
EDP (MIPI optional);
Supports both automated test pattern playback (with adjustable image dwell time) and manual control.
The signal testing system supports crosshair cursor positioning functionality.
The signal test system supports parameter configuration for screen lock time, frequency, VDD, VBL, and timing.
Traffic light support
Firmware burning support
Signal support
Signal support
Compact size
TV/Vehicle display test
Adopting independent BOX operation control
Third-party support
GMSL
EDID
4link_LVDS
8.1G_eDP
Easy to Carry
Available in medium/
large sizes
Support detachment from PC
AOI/Software
Product Function Description |
monochrome
character
crosshair
color bar
gradient
chessboard pattern
radiation
gray scale
· Lighting signal type：
· Test screen:
· Automatic screen switching function:
· Cross cursor function:
·System software editor:
· Test Pattern Configuration Function：
The PC-based software allows users to configure parameters—such as power on/off timing, scanning sequence, voltage/current protection ranges, and test patterns—based on the module’s technical specifications. It delivers comprehensive testing capabilities with user-friendly operation.
EDP (MIPI optional);
Supports both automated test pattern playback (with adjustable image dwell time) and manual control.
The signal testing system supports crosshair cursor positioning functionality.
The signal test system supports parameter configuration for screen lock time, frequency, VDD, VBL, and timing.
Protection support
System docking support
Support open language programming
Real time monitoring card control
Adopting independent BOX operation control
Independent compilation utility
Third-party support
OUP/OCP
CIM
Lua script
Voltage current
Simple program
Support detachment from PC
AOI/Software
Graphic visualization
Upper position interface
Product Function Description |
monochrome
character
crosshair
color bar
gradient
chessboard pattern
radiation
gray scale
· Lighting signal type：
· Test screen:
· Automatic screen switching function:
· Cross cursor function:
·System software editor:
· Test Pattern Configuration Function：
The PC-based software allows users to configure parameters—such as power on/off timing, scanning sequence, voltage/current protection ranges, and test patterns—based on the module’s technical specifications. It delivers comprehensive testing capabilities with user-friendly operation.
EDP (MIPI optional);
Supports both automated test pattern playback (with adjustable image dwell time) and manual control.
The signal testing system supports crosshair cursor positioning functionality.
The signal test system supports parameter configuration for screen lock time, frequency, VDD, VBL, and timing.
Protection support
System docking support
Support open language programming
Real time monitoring card control
Adopting independent BOX operation control
Independent compilation utility
Third-party support
OUP/OCP
CIM
Lua script
Voltage current
Simple program
Graphic visualization
Support detachment from PC
AOI/Software
Upper position interface
Product Function Description |
monochrome
character
crosshair
color bar
gradient
chessboard pattern
radiation
gray scale
· Lighting signal type：
· Test screen:
· Automatic screen switching function:
· Cross cursor function:
·System software editor:
·System software editor:
· Test Pattern Configuration Function：
The PC-based software allows users to configure parameters—such as power on/off timing, scanning sequence, voltage/current protection ranges, and test patterns—based on the module’s technical specifications. It delivers comprehensive testing capabilities with user-friendly operation.
EDP (MIPI optional);
Supports both automated test pattern playback (with adjustable image dwell time) and manual control.
The signal testing system supports crosshair cursor positioning functionality.
The signal test system supports parameter configuration for screen lock time, frequency, VDD, VBL, and timing.
Protection support
System docking support
Support open language programming
Real time monitoring card control
Adopting independent BOX operation control
Independent compilation utility
Third-party support
OUP/OCP
CIM
Lua script
Voltage current
Simple program
Graphic visualization
Support detachment from PC
AOI/Software
Upper position interface
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Tel: +86 21-62495999
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